Compact High Accuracy Probes
LSP-X1 is a compact, high accuracy and high performance 3D analog scanning probe that can rapidly collect thousands of data points providing a precise evaluation of part features, including form, location and size. LSP-X1 probes provide simultaneous and unclamped probing in all axes, always orthogonal to the contact surface.
The probe supports Single Point Probing, Continuous and High-Speed Scanning and Self-Centering modes. Self-Centering mode is particularly useful for measuring gears. The probe design uses friction, torsion and hysteresis free spring parallelograms for each axis while probing deflections are measured via high resolution Linear Variable Differential Transducers (LVDT).
LSP-X1 is available in two configurations: LSP-X1s and LSP-X1m, each characterized by different styli carrying length. The TESASTAR Kinematic Joint allows fast automatic probe changes using the TESASTAR-r autochange rack. Kinematic stylus holders allow fast and repeatable stylus change using the LSP-X1 stylus changer rack or the stylus changer ports for TESASTAR-r.
|Probe interface||TKJ (TESASTAR Kinematic Joint)|
|Dimensions||Ø 30 x 109 mm|
|Resolution||< 0.1 μm|
|Measuring range||± 2 mm in X, Y and Z|
|Deflection range||± 2 mm in all axes|
|Linear stiffness||LSP-X1s 1.2 N/mm
LSP-X1m 0.6 N/mm
|Max. stylus weight||20 g (incl. stylus holder)|
|Max. stylus length||LSP-X1s 20-115 mm
LSP-X1m 120-200 mm
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