The chromatic white light sensor (CWS) is based on the confocal measurement principle and works using chromatic depth scanning. This technique uses a special lens that refracts white light differentially, depending on its wavelength, to measure distances. The system resolution depends on the intensity of the light reflected from the surface of the inspected part.
The CWS achieves high measuring dynamics with highly reflective objects as well as light-absorbing objects.It is ideal for digitizing all freeform surfaces, measuring the thickness of glass or lenses and for capturing the topology of microstructures.
The CWS achieves a vertical resolution of up to 10 nm and a scanning rate of up to 1000 points per second.
| Technical Characteristics | ||||
| CWS Measuring Head | 10 mm | 3 mm | 600 µm | 300 µm |
| Working distance | 75 mm | 22.5mm | 6.5 mm | 4.5 mm |
| Resolution in Z direction | 300 nm | 100 nm | 20 nm | 10 nm |
| Diameter of CWS spot | 25 µm | 12 µm | 4 µm | 5 µm |
Hexagon Metrology, Inc.
250 Circuit Drive
North Kingstown, RI 02852
USA
Toll Free: 855.4.HEXMET
( 855.443.9638 )
Support: 800.343.7933
Phone: 401.886.2000
Fax: 401.886.2727
